The SphereOptics Reflectance Laboratory is equipped with state-of-the-art UV-VIS-NIR spectrophotometers, and provides DAkkS accredited calibration services for total hemispherical reflectance in accordance with DIN 5036. The ISO 17025 accredited measurements are in the spectral range 250-2450nm.
The spectral reflectance measurements are performed from 250 to 2450nm using a Perkin Elmer dual-beam, ratio-recording spectrophotometer, the Lambda 950 which is equipped with a 150mm integrating sphere for an 8°/H collection geometry. The Lambda 1050 is also equipped with an “ARTA” accessory that allows us to measure directional reflectance and BRDF (reflectance as a function of both incident and reflected angle – this service is not currently DAkkS-accredited).
The SphereOptics Reflectance Laboratory is equipped with state-of-the-art UV-VIS-NIR spectrophotometers, and provides DAkkS accredited calibration services for total hemispherical reflectance in accordance with DIN 5036. The ISO 17025 accredited measurements are in the spectral range 250-2450nm.
The spectral reflectance measurements are performed from 250 to 2450nm using a Perkin Elmer dual-beam, ratio-recording spectrophotometer, the Lambda 950, which is equipped with a 150mm integrating sphere for an 8°/H collection geometry. The Lambda 1050 is also equipped with an “ARTA” accessory that allows us to measure directional reflectance and BRDF (reflectance as a function of both incident and reflected angle – this service is not currently DAkkS accredited).
The measurement of spectral reflectance is performed in an 8° illumination geometry. In this configuration, the sample is mounted at the port of the integrating sphere at an angle of 8° with respect to the collimated illumination beam. This causes the specular reflection of the sample to hit the sphere wall, for specular-included (total) reflectance measurements. Alternatively, it is possible to have a light trap at the 8° position on the sphere wall for specular-excluded (diffuse-only) measurements. Subtracting the specular-excluded from the specular-included reflectance values yields the magnitude of the specular reflectance.
Reflectance measurements are performed with reference to a known, certified standard of reflectance, either NIST (USA) or PTB (Germany), depending on the type of calibration requested.
Standard measurements are performed in the range 250 to 2500nm in 1nm steps. The absolute accuracy (uncertainty) in range 300–1750nm is better than <0.45%. The wavelength accuracy of an absorption feature is <0.75nm in range 250-1900nm.
The SphereOptics laboratory provides DAkkS-accredited measurement services for spectral reflectance in accordance with DIN 5036 Part 3 11.79 for diffusely reflecting materials in the wavelength range from 250 to 2450nm (UV-VIS-NIR bands). We are proud that ours is the first and remains the only commercial laboratory in Europe to achieve ISO accreditation for the measurement and calibration of total hemispherical reflectance in both specular-included and specular-excluded geometries in accordance with DIN 5036.
Key Features of the Reflectance Measurement Service
Measurement Types | Total hemispheric reflectance (DAkkS accredited) Specular-only reflectance Diffuse-only reflectance Total hemispheric transmittance Directional reflectance & BRDF/BTDF |
Compliance | According to DIN 5036 Part 3: 11.79 for diffusely reflecting materials |
By Special Request | Total hemispheric reflectance as a function of angle of illumination |
Wavelength Range | 250-2450nm |
Recording Interval | 1nm |
Measurement Geometry | 8°/H (directional illumination at 8° to sample normal with total hemispheric collection) |
Sample Dimensions | Solid materials, 28-100mm diameter, up to 40mm thick, ideally flat (some curvature may be acceptable) |
Data Provided | Printed test report and on digital media |
Traceability | All reflectance measurements are made by substitution to reference artifacts that are calibrated by an NMI (e.g. NIST or PTB) |
Accreditation | Calibration services our provided under our DAkkS DIN EN ISO/IEC 17025:2018 scope of accreditation |
We would be delighted to quote for your reflectance measurement and calibration requirements. Please provide as much information as possible about your needs. Please share at least the following information with us using the button above.
What Type of Measurement is Required? | As standard we can perform measurements of total hemispherical reflectance, specular reflectance, diffuse reflectance and total hemispherical transmittance. By special arrangement we can also provide measurements of total hemispherical reflectance as a function of angle of illumination (not currently DAkkS accredited) |
What is the Required Wavelength Range? | Our standard measurements are performed between 250 to 2450nm |
Do you Require an Accredited Measurement? | We offer both a standard service as well as an optional service that is performed within the scope of our DAkkS ISO 17025 accreditation |
What are the Sample Dimensions? | Ideally, your samples shall be flat, 28-100mm diameter (or square) and no more than 40mm thick. Other shapes/sizes by special arrangement |
How Many Items do you Need Testing? | |
Reporting | What information do you need reporting?
As standard, we provide a printed test report as well as reflectance data compiled every 1nm on digital media |
Anything Else? | Please let us know if there are any other requirements! |
Datasheets
White Papers
Typical Calibration Certificate (SphereOptics)
DAkkS ISO 17025 Accreditation Certificate (SphereOptics)
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