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Hyperspectral Microscope to perform complex material analyses such as solar cell characterization and semiconductor quality control

Photon ETC’s IMA is a hyperspectral microscope delivering spectral and spatial information in the VIS, NIR, and SWIR wavelengths range (400 nm – 1620 nm). This system rapidly maps photoluminescence, electroluminescence, fluorescence, reflectance, and transmittance.

Based on high throughput global-imaging filters, IMA is faster and more efficient than standard point-by-point or line-scan based systems. Whether you like to perform complex material analyses such as solar cell characterization and semiconductor quality control or study IR markers in complex environments including live cells and tissue or your experiment requires darkfield images and obtain a contrast of transparent and unstained samples such as polymers, crystals or live cells – the IMA Hyperspectral Microscope is the system which enables you to realize such challenging measurements.